Scanning probe microscopy

Controllable patterning and CVD growth of isolated carbon nanotubes with direct write of catalyst using Dip Pen Nanolithography

I. Kuljanishvili, D. A. Dikin, S. Rozhok, S. Mayle and V. Chandrasekhar

dc and High Frequency Magnetic Properties of Nano-patterned CoFe2O4 Arrays Fabricated Using Sol-gel Precursors

Goutam Sheet, Alexandra R. Cunliffe, Erik J. Offerman, Chad M. Folkman, Chang-Beom Eom, and Venkat Chandrasekhar

Pseudogap Formation in the Metallic State of LSMO Thin Films

Udai Raj Singh, Anjan K. Gupta, Goutam Sheet, Venkat Chandrasekhar, H.W. Jang and C.B. Eom, Appl. Phys. Lett. 93, 212503 (2008)

Low-temperature scanning force microscopy using a tuning fork transducer

Y. Seo, P. Cadden-Zimansky and V. Chandrasekhar, Journal of the Korean Physical Society 50, 378 (2007).

Seeing the unseen: The scanning probe microscope and nanoscale measurement

Kenneth Turner, Emma Tervaarwerk, Nathan Unterman, Marcel Grdinic, Jason Campbell, Venkat Chandrasekhar and R.P.H. Chang, The Science Teacher, pg. 58, December 2006

Low-temperature high-resolution magnetic force microscopy using a quartz tuning-fork

Yongho Seo, Paul Cadden-Zimansky, and Venkat Chandrasekhar, Applied Physics Letters 87, 103103 (2005)

Epitaxial Magnetic Perovskite Nanostructures

Dmitry Ruzmetov, Yongho Seo, Land J. Belenky, Dong-Min Kim, Xianglin Ke, Haiping Sun, Venkat Chandrasekhar,* Chang-Beom Eom, Mark S. Rzchowski, and Xiaoqing Pan, Advanced Materials 17, 2869 (2005)

Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe

S. Rozhok, S. Jung, V. Chandrasekhar, Xiwei Lin and Vinayak P. Dravid, J. Vac. Sci. Technol. B 21, 323 (2003)

Application of commercially available cantilevers in tuning fork scanning probe microscopy (SPM) studies

S. Rozhok and V. Chandrasekhar, Solid State Communicatios 121, 683 (2002)